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con_telApplied Electronics Laboratory
Department of Electrical & Computer Engineering
University of Patras
Campus of Rion, Patras 26500, Greece

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A measuring method for laser-based profilometry and its applications in non-destructive testing and quality control

Research Area: Uncategorized Year: 2002
Type of Publication: In Proceedings
Authors:
Book title: SPIE - The International Society for Optical Engineering 2002 Number: 4827
Pages: 553-563
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Language selection:  GreekEnglish (United Kingdom)

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Applied Electronics Laboratory, Department of Electrical & Computer Engineering, University of Patras